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  3. Applied Metrology USA

  4. 300mm theory and practice - Semiconductor Digest

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  6. TSI - Wafer & Reticle Contamination Standards

    Particles can be deposited on bare, film, and patterned wafers from 100mm to 300mm. Download the Wafer & Photomask Surface Defect Contamination Standards brochure to learn how MSP can help improve your surface defect …

  7. Liquid contamination control in semiconductor manufacturing: a …

  8. Silicon Wafer Fabrication Challenges | CleanAir …

    Jul 1, 2013 · With a handful of 300-mm silicon wafer production lines up and running, contamination control data is starting to emerge, pointing out sources of contamination within the tools, the infrastructure and the silicon wafer itself.

  9. Inspection Systems for Foups (300mm Silicon Wafers)

    The automated FOUP Inspection System by ATG Technologies is one of the latest and most reliable systems and is essential if you are looking for wafer defects related to FOUP integrity reduction in your Fab.

  10. TSI - Wafer and Reticle Contamination Standards

  11. Preventing wafer contamination - Cleanroom Technology

  12. Characterization and control of microcontamination for advanced ...

  13. St. Louis region silicon wafer plant to get federal millions | STLPR

  14. $400M in Federal Funding Advances Manufacturing Innovation in …

  15. GlobalWafers (Missouri) | NIST - National Institute of Standards …

  16. GlobalWafers: Leading Supplier of Silicon Wafers

  17. Fabrication and characterization of low-loss Al/Si/Al parallel plate ...

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